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Connector Mating, Normal Force and SI
Presented by: Juan Aguirre

The purpose of this study is to observe the impact of normal forces in Signal Integrity. Where compressing/matting interconnect solutions carries particular deflection percentage on pin contacts, as well as the amount of surface contact area, and how these full vs partial matted solutions behaves in our results (Characteristic impedance TDR, RL). How to spot them in our measurements and ways to mitigate for them.

Apr 28, 2022 02:15 PM in Eastern Time (US and Canada)

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